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Schottky Barrier Mapping and Measurement
The Schottky barrier is an electrostatic barrier between a metal and a semiconductor that has a high technological relevance in modern integrated circuits and devices. The barrier height is intimately tied to the bonding and charge transfer that occurs at the interface. The barrier height can fluctuate laterally due to changes in the bonding and the presence of defects or foreign species. Our group has the ability to map the Schottky barrier with nanoscale resolution to give insight into these lateral fluctuations.